R&D alliances and the effect of experience on
innovation: a focus on the semiconductor industry.
by Rubin de Celis, Jaime C.^Lipinski, John
7 8 9
1. PATENT
2. EXPERIENCE (LOG)
3. PATENT (FIRM)
4. PATENT (PARTNER)
5. TECH DIVERSITY
6. TECH DIVERSITY2
7. INTERNATIONAL 1.000
8. MULTILATERAL -0.204 *** 1.000
9. OTHER ALLIANCE -0.069 -0.073 1.000
10. YEAR98 -0.052 0.072 -0.015
11. SCOPE NARROW 0.032 -0.031 -0.055
12 SCOPE BROAD -0.114 -0.014 0.117
Mean 0.38 0.13 0.86
Median 0.00 0.00 1.00
Minimum 0.00 0.00 0.00
Maximum 1.00 1.00 1.00
Standard deviation 0.49 0.34 0.35
10 11 12
1. PATENT
2. EXPERIENCE (LOG)
3. PATENT (FIRM)
4. PATENT (PARTNER)
5. TECH DIVERSITY
6. TECH DIVERSITY2
7. INTERNATIONAL
8. MULTILATERAL
9. OTHER ALLIANCE
10. YEAR98 1.000
11. SCOPE NARROW -0.004 1.000
12 SCOPE BROAD -0.115 -0.217 *** 1.000
Mean 0.29 0.29 0.14
Median 0.00 0.00 0.00
Minimum 0.00 0.00 0.00
Maximum 1.00 1.00 1.00
Standard deviation 0.46 0.45 0.35
Significant at * 10%, ** 5%, and *** 1% level for one-tailed tests.
Table 4
Previous Alliance Experience and Innovative Performance
1 2
INTERCEPT -3.967 -3.647
EXPERIENCE (LOG) 0.365 ***
EXPERIENCE (COUNT) 0.058 ***
EXPERIENCE > 0
EXPERIENCE = 1-5
EXPERIENCE = 6-10
EXPERIENCE > 10
PATENT (FIRM) 0.001 *** 0.001 ***
PATENT (PARTNER) 0.000 0.000
TECH DIVERSITY 25.381 *** 24.924 ***
TECH DIVERSITY2 -18.839 *** -18.630 ***
INTERNATIONAL 0.203 0.185
MULTILATERAL 0.741 ** 0.798 **
OTHER ALLIANCE 0.314 0.321
YEAR98 -0.012 -0.037
SCOPE NARROW 0.037 0.009
SCOPE BROAD 0.673 0.637
n 182 182
Wald chi-square 201.54 207.02
3 4
INTERCEPT -2.901 -3.649
EXPERIENCE (LOG)
EXPERIENCE (COUNT)
EXPERIENCE > 0 0.910 *
EXPERIENCE = 1-5 0.776
EXPERIENCE = 6-10 0.441
EXPERIENCE > 10 1.489 **
PATENT (FIRM) 0.001 *** 0.001 ***
PATENT (PARTNER) 0.000 0.000
TECH DIVERSITY 21.313 ** 23.099 ***
TECH DIVERSITY2 -17.050 ** -17.130 ***
INTERNATIONAL 0.247 0.189
MULTILATERAL 0.823 ** 0.670 **
OTHER ALLIANCE 0.514 0.220
YEAR98 -0.068 -0.039
SCOPE NARROW 0.202 0.084
SCOPE BROAD 0.681 0.583
n 182 182
Wald chi-square 174.43 178.34
Note: Negative binomial estimation. Dependent variable
is citation-weighted patents issued to each firm in a
postalliance period. Positive coefficients indicate
increased patent output.
Significant at * 10%, ** 5%, and *** 1% level for one-tailed tests.
Table 5
Previous Alliance Experience and
Innovative Performance
5 6
INTERCEPT -1.986 -1.635
EXPERIENCE: 1 YEAR 0.067
EXPERIENCE: 2 YEARS 0.162 **
EXPERIENCE: 3 YEARS 0.196 ***
EXPERIENCE: 4 YEARS -0.112
EXPERIENCE: 5 YEARS -0.011
EXPERIENCE: 6 YEARS 0.063
EXPERIENCE:
YEARS 1 AND 2 0.122
EXPERIENCE:
YEARS 3 AND 4 0.096 **
EXPERIENCE:
YEARS 5 AND 6 0.013
PATENT (FIRM) 0.001 *** 0.001 ***
PATENT (PARTNER) 0.000 0.000
TECH DIVERSITY 22.589 ** 22.086 **
TECH DIVERSITY2 -17.257 *** -17.421 ***
INTERNATIONAL 0.068 0.069
MULTILATERAL 0.805 ** 0.791
OTHER ALLIANCE 0.091 0.086
YEAR98 0.039 * 0.049 *
SCOPE NARROW -0.128 -0.118
SCOPE BROAD 0.592 0.799
n 182 182
Wald chi-square 221.22 221.54
Note: Negative binomial estimation. Dependent variable is
citation-weighted patents issued to each firm in a postalliance
period. Positive coefficients indicate increased patent output.
Significant at * 10%, ** 5%, and *** 1% level for one-tailed
tests.
COPYRIGHT 2007 Baker College System - Center for
Graduate Studies Reproduced with permission of the copyright holder. Further reproduction or distribution is prohibited without permission.
Copyright 2007, Gale Group. All rights
reserved. Gale Group is a Thomson Corporation Company.
NOTE: All illustrations and photos have been removed from this article.