9780769532646
On-line testing symposium; proceedings.
International On-Line Testing Symposium (14th: 2008: Rhodes,
Greece)
Computer Society Press
2008
305 pages
$190.00
Paperback
TK7867
This proceedings collects approximately 55 papers presented at the
14th IEEE online testing symposium held in Rhodes, Greece in July 2008,
discussing software engineering topics for electronic testing. The
editors (associated with Y. of Athens and U. of Piraeus, Greece; TIMA
laboratory, France; and Intel) present the articles under the following
themes: online error detection and correction, self-checking circuits
and error detecting codes, radiation hardening techniques, soft error
detection and correction methodologies, control-flow checking and
fault-tolerance in special applications, fault injection, benchmarking
and standardization in software-based SER characterization, mitigation
techniques for transient errors, memory self-test and self-repair,
posters, reliability and circuit stimulation, networks-on-chip and
labs-on-chip, parametric testing techniques, radiation-induced SER,
self-test generation techniques, and laser-based fault injection in
memories. This book contains an author index only.
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NOTE: All illustrations and photos have been removed from this article.