9780769531502
European test symposium; proceedings.
IEEE European Test Symposium (13th: 2008: Verbania, Italy)
Computer Society Press
2008
205 pages
$187.00
Paperback
TK7874
A May 2008 symposium discussed trends, emerging results, hot
topics, and practical applications in the area of electronic-based
circuit and systems testing. Papers from the symposium are presented
here, in sections on testing and monitoring for high-quality
requirements, SoC infrastructure and testing, advances in RF testing,
safe test generation and design validation, memory test, industrial
applications, simulation and test generation of delay faults, on-chip
resources for mixed-signal devices, solutions for yield enhancement,
on-line checking, and soft error mitigation. Some specific areas
described are bridge defect diagnosis for multiple-voltage design,
bypassing blocking bugs during post-silicon validation, accelerated
shift registers for x-tolerant test data compaction, and jitter
decomposition in high-speed communication systems. There is no subject
index.
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