The importance of antenna calibration.(EMC TEST)(American
National Standards Institute)
In the United States and many parts of the world, antenas are
calibrated per the American National Standards Institute C63.5: American
National Standard for Electromagnetic Compatibility--Radiated . . .
Vision system online help.(MACHINE VISION)
Machine vision applications involve widely varying degrees of
difficulty. Some are straightforward and easily handled by one of the
so-called smart cameras. Smart cameras have sufficient . . .
Communications Test Buyers Guide.(Buyers guide)
EE's annual Communications Test Buyers Guide is a
comprehensive, up-to date listing of the companies that specialize in
communications test, including ATM; CDMA/TDMA; fiberoptics; ISDN; . . .
Nano-measurements need mega-care.(NANOELECTRONICS TEST)
Nanoelectronics and nano-material research typically involves
sourcing and measuring very small voltage and currents. In addition,
it's common to require a means of holding and contacting . . .
Fundamentals of semiconductor C-V
measurements.(capacitance-voltage)
Capacitance-Voltage (C-V) testing is widely used to determine
semicondutor parameters, particularly in MOSCAP and MOSFET structures.
However, other types of semiconductor devices and technologies . . .
Emerging Synthetic Instruments and IVI driver solutions.(TEST
SOFTWARE)(Synthetic Instrument Working Group)
The U.S. Department of Defense's Synthetic Instrument Working
Group (SIWG) originally defined synthetic instruments (SIs) in 2004 as
elemental hardware and software components with standardized . . .
Compact DSOs support 20,000 history memories.(PRODUCT
BRIEFING)(Yokogawa North America)(Brief article)
The DLM2000 Series of compact mixed-signal oscilloscopes (MSOs)
provides up to 500 MHz bandwidh, 2-GS/s sampling speed, and a memory up
to 125 Mpoints. Six models make up the series: three with two . . .
USB 3.0 test tools verify silicon compliance.(PRODUCT
BRIEFING)(Tektronix Inc.)(Brief article)
A comprehensive test for the new SuperSpeed USB 3.0 specification
has been developed to ensure interface IC and consumer product
compliance. SuperSpeed USB, which operates at 5 Gb/s, will adopt a . . .
Modules and chassis offer fast wireless measurements.(PRODUCT
BRIEFING)(National Instruments Corp.)(Brief article)
New to the RF test arena are the PXle-5663 Vector Signal Analyzer
and the PXle-5673 Vector Signal Generator complemented by the PXle-1075
Chassis. The PXle-5663 performs signal analysis from 10 MHz . . .
Switching Module designed for USB format.(PRODUCT
BRIEFING)(Signametrics)(universal serial bus)(Brief article)
The SMU4032 Switching Module is a compact, true instrumentation
mulltiplexer powered by USB. It provides 35 differential inputs that can
be cinfigured on the fly into a single 35:1 differential . . .
Unit combines DSO and DMM capabilities.(PRODUCT BRIEFING)(Protek
Test and Measurement)(Brief article)
The Model S2505 integrates a battery-operated, dual-channel, 5-MHz
bandwidth DSO with a 50-MS/s sampling rate and a 10,000-count true rms
DMM with datalogging memory to 17,000 points. The DSO also . . .
Scope analysis tool extracts eye diagram data.(PRODUCT
BRIEFING)(LeCroy)(Brief article)
The SDA 7 Zi Oscilloscope with SDA II includes Iso BER [TM], an
analysis tool that extrapolates the eye diagram data and displays the
lines of bit error rate directly on the eye. This helps to . . .
Dual-channel supply developed for battery-powered
devices.(PRODUCT BRIEFING)(Keithley Instruments Inc.)(Brief
article)
The Model 2308 is a dual-channel battery-and charger-simulating
power supply for high-speed testing of battery-power devices. It
maintains a stable output voltage in response to pulse loads with . . .
Enhanced test development software creates libraries.(PRODUCT
BRIEFING)(ATEasy 7.0)(Brief article)
ATEasy 7.0, the latest version of the test development software and
test executive environment features a Library Wizard that creates a
Library DLL project. Export commands permit generating. vb/.h . . .
Tool Suite features JTAG functional emulation test.(PRODUCT
BRIEFING)(Corelis Inc.)(Brief article)
Version 6.6 of the ScanExpress Boundary Scan Tool Suite combines
ScanExpress JTAG Emulation Test (JET) with the capabilities of Scan
Express TPG Test Development and Scan Express Runner Test . . .
Power Source displays four readings simultaneously.(PRODUCT
BRIEFING)(Associated Power Technologies)(Brief article)
The 4-KVA 5040 AC Power Source provides a variable output voltage
from 0 to 300 V and output frequencies from 40 to 450 Hz. The input
voltage is 208 with an input frequency from 47 to 500 Hz. Four . . .
Remote controller applies JTAG/Boundary scan tests.(PRODUCT
BRIEFING)(InterTech)(Brief article)
The RIC-1000 is the first development in the company's Remote
instrumentation Controller family that applies JTAG/boundary scan tests
directly over the internet. It connects locally to a circuit . . .
Test solution spans Digital and RF domains.(PRODUCT
BRIEFING)(Agilent Technologies Inc.)(radio frequency)(Brief
article)
The Digital Radio Frequency (DigRF) V4 digital serial bus between
mobile baseband and RF chips is promoted by the Mobile Industry
processor Interface (MIPI) Alliance. Agilent's test . . .
It's the economy.(International Test
Conference)(Editorial)
The International Test Conference (ITC) was held at the Santa Clara
Convention Center last week with the usual slate of activities typical
of many trade shows. New at ITC this year was the Poster . . .
Antennas for HIRF testing.(EMC TEST EQUIPMENT)
A suite of three high-gain, high-power microwave horn antennas
supplies high intensity fields for DO 160 HIRF testing. The 2-GHz to
4-GHZ Model AT4444 handles 1,000-W CW and 7-kW with pulse input . . .
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